TY  - RPRT
TI  - Theoretical analysis of thermal boundary conductance of MoS2-SiO2 and WS2-SiO2 interface
AU  - Zhun-Yong Ong
AU  - Yongqing Cai
AU  - Gang Zhang
AU  - Yong-Wei Zhang
PY  - 2021
DO  - 10.1088/1361-6528/abd208
UR  - https://arxiv.org/abs/2101.03310
ID  - 2101.03310
ER  -