TY  - RPRT
TI  - Carrier Density and Thickness Dependent Proximity Effect in Doped Topological Insulator -- Metallic Ferromagnet Bilayers
AU  - Yaron Jarach
AU  - Gad Koren
AU  - Netanel H. Lindner
AU  - Amit Kanigel
PY  - 2021
DO  - 10.1103/physrevb.103.205407
UR  - https://arxiv.org/abs/2101.04536
ID  - 2101.04536
ER  -