TY  - RPRT
TI  - How Thermal Annealing Process Determines the Inherent Structure Evolution in Amorphous Silicon: An Investigation from Atomistic Time Scales to Experimental Time Scales
AU  - Yanguang Zhou
PY  - 2021
UR  - https://arxiv.org/abs/2101.10536
ID  - 2101.10536
ER  -