TY  - RPRT
TI  - Disorder effects in topological insulator thin films
AU  - Yi Huang
AU  - B. I. Shklovskii
PY  - 2021
DO  - 10.1103/physrevb.103.165409
UR  - https://arxiv.org/abs/2102.00352
ID  - 2102.00352
ER  -