@misc{indiciaefa97d0f37b48,
  title = {Alleviation of Temperature Variation Induced Accuracy Degradation in Ferroelectric FinFET Based Neural Network},
  author = {Sourav De and Hoang-Hiep Le and Md. Aftab Baig and Yao-Jen Lee and Darsen D. Lu and Thomas Kämpfe},
  year = {2022},
  doi = {10.1109/led.2021.3089621},
  url = {https://arxiv.org/abs/2103.03111},
  note = {Source identifier: 2103.03111}
}