TY  - RPRT
TI  - Alleviation of Temperature Variation Induced Accuracy Degradation in Ferroelectric FinFET Based Neural Network
AU  - Sourav De
AU  - Hoang-Hiep Le
AU  - Md. Aftab Baig
AU  - Yao-Jen Lee
AU  - Darsen D. Lu
AU  - Thomas Kämpfe
PY  - 2022
DO  - 10.1109/led.2021.3089621
UR  - https://arxiv.org/abs/2103.03111
ID  - 2103.03111
ER  -