@misc{indiciae65d5748c02f1,
  title = {Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization},
  author = {Frances I Allen and Thomas C Pekin and Arun Persaud and Steven J Rozeveld and Gregory F Meyers and Jim Ciston and Colin Ophus and Andrew M Minor},
  year = {2021},
  doi = {10.1017/s1431927621011946},
  url = {https://arxiv.org/abs/2103.07076},
  note = {Source identifier: 2103.07076}
}