TY  - RPRT
TI  - Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
AU  - Frances I Allen
AU  - Thomas C Pekin
AU  - Arun Persaud
AU  - Steven J Rozeveld
AU  - Gregory F Meyers
AU  - Jim Ciston
AU  - Colin Ophus
AU  - Andrew M Minor
PY  - 2021
DO  - 10.1017/s1431927621011946
UR  - https://arxiv.org/abs/2103.07076
ID  - 2103.07076
ER  -