@misc{indiciae5b410230f39d,
  title = {DIALED: Data Integrity Attestation for Low-end Embedded Devices},
  author = {Ivan De Oliveira Nunes and Sashidhar Jakkamsetti and Gene Tsudik},
  year = {2021},
  url = {https://arxiv.org/abs/2103.12928},
  note = {Source identifier: 2103.12928}
}