@misc{indiciae8389b49451a4,
  title = {Product Inspection Methodology via Deep Learning: An Overview},
  author = {Tae-Hyun Kim and Hye-Rin Kim and Yeong-Jun Cho},
  year = {2021},
  doi = {10.3390/s21155039},
  url = {https://arxiv.org/abs/2103.16198},
  note = {Source identifier: 2103.16198}
}