TY  - RPRT
TI  - Product Inspection Methodology via Deep Learning: An Overview
AU  - Tae-Hyun Kim
AU  - Hye-Rin Kim
AU  - Yeong-Jun Cho
PY  - 2021
DO  - 10.3390/s21155039
UR  - https://arxiv.org/abs/2103.16198
ID  - 2103.16198
ER  -