TY  - RPRT
TI  - The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications
AU  - Aneesh Balakrishnan
AU  - Thomas Lange
AU  - Maximilien Glorieux
AU  - Dan Alexandrescu
AU  - Maksim Jenihhin
PY  - 2021
DO  - 10.1109/norchip.2019.8906974
UR  - https://arxiv.org/abs/2104.01900
ID  - 2104.01900
ER  -