TY  - RPRT
TI  - Accessing slip activity in high purity tin with electron backscatter diffraction and measurement of slip strength
AU  - Tianhong Gu
AU  - Finn Giuliani
AU  - T. Ben Britton
PY  - 2023
UR  - https://arxiv.org/abs/2104.02681
ID  - 2104.02681
ER  -