TY  - RPRT
TI  - Characterization and Modeling of Native MOSFETs Down to 4.2 K
AU  - Yuanke Zhang
AU  - Tengteng Lu
AU  - Wenjie Wang
AU  - Yujing Zhang
AU  - Jun Xu
AU  - Chao Luo
AU  - Guoping Guo
PY  - 2021
DO  - 10.1109/ted.2021.3099775
UR  - https://arxiv.org/abs/2104.03094
ID  - 2104.03094
ER  -