@misc{indiciae35c7232f4199,
  title = {Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements},
  author = {K. Yokoyama and J. S. Lord and J. Miao and P. Murahari and A. J. Drew},
  year = {2021},
  doi = {10.1063/5.0054291},
  url = {https://arxiv.org/abs/2104.03785},
  note = {Source identifier: 2104.03785}
}