TY  - RPRT
TI  - Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements
AU  - K. Yokoyama
AU  - J. S. Lord
AU  - J. Miao
AU  - P. Murahari
AU  - A. J. Drew
PY  - 2021
DO  - 10.1063/5.0054291
UR  - https://arxiv.org/abs/2104.03785
ID  - 2104.03785
ER  -