@misc{indiciaef13186efff73,
  title = {The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors},
  author = {D. Simatos and L. J. Spalek and U. Kraft and M. Nikolka and X. Jiao and C. R. McNeill and D. Venkateshvaran and H. Sirringhaus},
  year = {2021},
  doi = {10.1063/5.0044785},
  url = {https://arxiv.org/abs/2104.07089},
  note = {Source identifier: 2104.07089}
}