@misc{indiciae8e55cf71149b,
  title = {Temperature Dependent Reverse Recovery Characterization of SiC MOSFETs Body Diode forSwitching Loss Estimation In a Half-Bridge},
  author = {Debiprasad Nayak and Yakala Ravi Kumar and Manish Kumar and Sumit Pramanick},
  year = {2021},
  url = {https://arxiv.org/abs/2104.09271},
  note = {Source identifier: 2104.09271}
}