TY  - RPRT
TI  - Temperature Dependent Reverse Recovery Characterization of SiC MOSFETs Body Diode forSwitching Loss Estimation In a Half-Bridge
AU  - Debiprasad Nayak
AU  - Yakala Ravi Kumar
AU  - Manish Kumar
AU  - Sumit Pramanick
PY  - 2021
UR  - https://arxiv.org/abs/2104.09271
ID  - 2104.09271
ER  -