@misc{indiciaeaa0ce3b36a47,
  title = {Bias-dependent intrinsic RF thermal noise modeling and characterization of single layer graphene FETs},
  author = {Nikolaos Mavredakis and Anibal Pacheco-Sanchez and Paulius Sakalas and Wei Wei and Emiliano Pallecchi and Henri Happy and David Jimenez},
  year = {2021},
  doi = {10.1109/tmtt.2021.3105672},
  url = {https://arxiv.org/abs/2104.11518},
  note = {Source identifier: 2104.11518}
}