TY  - RPRT
TI  - Bias-dependent intrinsic RF thermal noise modeling and characterization of single layer graphene FETs
AU  - Nikolaos Mavredakis
AU  - Anibal Pacheco-Sanchez
AU  - Paulius Sakalas
AU  - Wei Wei
AU  - Emiliano Pallecchi
AU  - Henri Happy
AU  - David Jimenez
PY  - 2021
DO  - 10.1109/tmtt.2021.3105672
UR  - https://arxiv.org/abs/2104.11518
ID  - 2104.11518
ER  -