@misc{indiciae96b064028807,
  title = {Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K},
  author = {Yuanke Zhang and Chao Luo and Tengteng Lu and Yujing Zhang and Jun Xu and Guoping Guo},
  year = {2021},
  url = {https://arxiv.org/abs/2104.12165},
  note = {Source identifier: 2104.12165}
}