TY  - RPRT
TI  - Optical microscopy-based thickness estimation in thin GaSe flakes
AU  - Wenliang Zhang
AU  - Qinghua Zhao
AU  - Sergio Puebla
AU  - Tao Wang
AU  - Riccardo Frisenda
AU  - Andres Castellanos-Gomez
PY  - 2021
DO  - 10.1016/j.mtadv.2021.100143
UR  - https://arxiv.org/abs/2105.03496
ID  - 2105.03496
ER  -