TY  - RPRT
TI  - CLARQ: A Dynamic ARQ Solution for Ultra-high Closed-loop Reliability
AU  - Bin Han
AU  - Yao Zhu
AU  - Muxia Sun
AU  - Vincenzo Sciancalepore
AU  - Yulin Hu
AU  - Hans D. Schotten
PY  - 2021
DO  - 10.1109/twc.2021.3095165
UR  - https://arxiv.org/abs/2105.09551
ID  - 2105.09551
ER  -