@misc{indiciae38a223cc06ce,
  title = {Charge-noise resilience of two-electron quantum dots in Si/SiGe heterostructures},
  author = {H. Ekmel Ercan and Mark Friesen and S. N. Coppersmith},
  year = {2021},
  doi = {10.1103/physrevlett.128.247701},
  url = {https://arxiv.org/abs/2105.10643},
  note = {Source identifier: 2105.10643}
}