TY  - RPRT
TI  - Charge-noise resilience of two-electron quantum dots in Si/SiGe heterostructures
AU  - H. Ekmel Ercan
AU  - Mark Friesen
AU  - S. N. Coppersmith
PY  - 2021
DO  - 10.1103/physrevlett.128.247701
UR  - https://arxiv.org/abs/2105.10643
ID  - 2105.10643
ER  -