@misc{indiciae179f4d8eaf5e,
  title = {Measurements and modeling of atomic-scale sidewall roughness and losses in integrated photonic devices},
  author = {Samantha Roberts and Xingchen Ji and Jaime Cardenas and Mateus Corato-Zanarella and Michal Lipson},
  year = {2022},
  doi = {10.1002/adom.202102073},
  url = {https://arxiv.org/abs/2105.11477},
  note = {Source identifier: 2105.11477}
}