TY  - RPRT
TI  - Characterization of self-heating in cryogenic high electron mobility transistors using Schottky thermometry
AU  - Alexander Y. Choi
AU  - Iretomiwa Esho
AU  - Bekari Gabritchidze
AU  - Jacob Kooi
AU  - Austin J. Minnich
PY  - 2021
DO  - 10.1063/5.0063331
UR  - https://arxiv.org/abs/2105.11571
ID  - 2105.11571
ER  -