@misc{indiciaee23011d4208a,
  title = {A Measurement Study on the (In)security of End-of-Life (EoL) Embedded Devices},
  author = {Dingding Wang and Muhui Jiang and Rui Chang and Yajin Zhou and Baolei Hou and Xiapu Luo and Lei Wu and Kui Ren},
  year = {2021},
  url = {https://arxiv.org/abs/2105.14298},
  note = {Source identifier: 2105.14298}
}