TY  - RPRT
TI  - Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures
AU  - P. A. 't Hart
AU  - M. Babaie
AU  - A. Vladimirescu
AU  - F. Sebastiano
PY  - 2021
UR  - https://arxiv.org/abs/2106.07982
ID  - 2106.07982
ER  -