@misc{indiciae87db04457639,
  title = {A new symmetry-based extraction method of Schottky diode parameters from resistance-compensated I-V characteristics},
  author = {Richard Opio Ocaya and Fahrettin Yakuphanoglu},
  year = {2021},
  doi = {10.1016/j.measurement.2021.110105},
  url = {https://arxiv.org/abs/2106.12324},
  note = {Source identifier: 2106.12324}
}