TY  - RPRT
TI  - A new symmetry-based extraction method of Schottky diode parameters from resistance-compensated I-V characteristics
AU  - Richard Opio Ocaya
AU  - Fahrettin Yakuphanoglu
PY  - 2021
DO  - 10.1016/j.measurement.2021.110105
UR  - https://arxiv.org/abs/2106.12324
ID  - 2106.12324
ER  -