TY  - RPRT
TI  - Reduction of Trapping and Recombination in Upgraded Metallurgical Grade Silicon: Impact of Phosphorous Diffusion Gettering
AU  - N. Dasilva-Villanueva
AU  - S. Catalán-Gómez
AU  - D. Fuertes Marrón
AU  - J. J. Torres
AU  - M. García-Corpas
AU  - C. del Cañizo
PY  - 2021
DO  - 10.1016/j.solmat.2021.111410
UR  - https://arxiv.org/abs/2106.15926
ID  - 2106.15926
ER  -