@misc{indiciaee82ea264f1ab,
  title = {Vertical GaN Devices: Process and Reliability},
  author = {Shuzhen You and Karen Geens and Matteo Borga and Hu Liang and Herwig Hahn and Dirk Fahle and Michael Heuken and Kalparupa Mukherjee and Carlo De Santi and Matteo Meneghini and Enrico Zanoni and Martin Berg and Peter Ramvall and Ashutosh Kumar and Mikael T. Björk and B. Jonas Ohlsson and Stefaan Decoutere},
  year = {2021},
  doi = {10.1016/j.microrel.2021.114218},
  url = {https://arxiv.org/abs/2107.02469},
  note = {Source identifier: 2107.02469}
}