@misc{indiciaee6e3b05b4c50,
  title = {OFF-state trapping phenomena in GaN HEMTs: interplay between gate trapping, acceptor ionization and positive charge redistribution},
  author = {E. Canato and M. Meneghini and C. De Santi and F. Masin and A. Stockman and P. Moens and E. Zanoni and G. Meneghesso},
  year = {2021},
  doi = {10.1016/j.microrel.2020.113841},
  url = {https://arxiv.org/abs/2107.05934},
  note = {Source identifier: 2107.05934}
}