@misc{indiciaeeec0180e65a4,
  title = {High resolution depth profiling using near-total-reflection hard X-ray photoelectron spectroscopy},
  author = {Julien E. Rault and Cheng-Tai Kuo and Henrique P. Martins and Giuseppina Conti and Slavomir Nemšák},
  year = {2021},
  doi = {10.1116/6.0001289},
  url = {https://arxiv.org/abs/2107.07007},
  note = {Source identifier: 2107.07007}
}