TY  - RPRT
TI  - High resolution depth profiling using near-total-reflection hard X-ray photoelectron spectroscopy
AU  - Julien E. Rault
AU  - Cheng-Tai Kuo
AU  - Henrique P. Martins
AU  - Giuseppina Conti
AU  - Slavomir Nemšák
PY  - 2021
DO  - 10.1116/6.0001289
UR  - https://arxiv.org/abs/2107.07007
ID  - 2107.07007
ER  -