TY  - RPRT
TI  - Optical Inspection of the Silicon Micro-strip Sensors for the CBM Experiment employing Artificial Intelligence
AU  - E. Lavrik
AU  - M. Shiroya
AU  - H. R. Schmidt
AU  - A. Toia
AU  - J. M. Heuser
PY  - 2021
DO  - 10.1016/j.nima.2021.165932
UR  - https://arxiv.org/abs/2107.07714
ID  - 2107.07714
ER  -