@misc{indiciaed7bcdc3cf70d,
  title = {Short Term Reliability and Robustness of ultra-thin barrier, 110 nm-gate AlN/GaN HEMTs},
  author = {Zhan Gao and Matteo Meneghini and Kathia Harrouche and Riad Kabouche and Francesca Chiocchetta and Daniele Marcon and Etienne Okada and Fabiana Rampazzo and Carlo De Santi and Farid Medjdoub and Gaudenzio Meneghesso and Enrico Zanoni},
  year = {2021},
  doi = {10.1016/j.microrel.2021.114199},
  url = {https://arxiv.org/abs/2107.08410},
  note = {Source identifier: 2107.08410}
}