@misc{indiciae38d3185b606b,
  title = {Degradation mechanism of 0.15 um AlGaN/GaN HEMTs: effects of hot electrons},
  author = {Z. Gao and F. Rampazzo and M. Meneghini and C. De Santi and F. Chiocchetta and D. Marcon and G. Meneghesso and E. Zanoni},
  year = {2021},
  doi = {10.1016/j.microrel.2020.113905},
  url = {https://arxiv.org/abs/2107.08413},
  note = {Source identifier: 2107.08413}
}