@misc{indiciae504ebc5aedbe,
  title = {Predicting Power Electronics Device Reliability under Extreme Conditions with Machine Learning Algorithms},
  author = {Carlos Olivares and Raziur Rahman and Christopher Stankus and Jade Hampton and Andrew Zedwick and Moinuddin Ahmed},
  year = {2021},
  url = {https://arxiv.org/abs/2107.10292},
  note = {Source identifier: 2107.10292}
}