TY  - RPRT
TI  - Predicting Power Electronics Device Reliability under Extreme Conditions with Machine Learning Algorithms
AU  - Carlos Olivares
AU  - Raziur Rahman
AU  - Christopher Stankus
AU  - Jade Hampton
AU  - Andrew Zedwick
AU  - Moinuddin Ahmed
PY  - 2021
UR  - https://arxiv.org/abs/2107.10292
ID  - 2107.10292
ER  -