TY  - RPRT
TI  - Variability of electron and hole spin qubits due to interface roughness and charge traps
AU  - Biel Martinez
AU  - Yann-Michel Niquet
PY  - 2021
DO  - 10.1103/physrevapplied.17.024022
UR  - https://arxiv.org/abs/2107.10902
ID  - 2107.10902
ER  -