@misc{indiciae9340e6c0ced3,
  title = {X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator},
  author = {Rafaela F. S. Penacchio and Celso I. Fornari and Yori G. Camillo and Philipp Kagerer and Sebastian Buchberger and Martin Kamp and Hendrik Bentmann and Friedrich Reinert and Sergio L. Morelhao},
  year = {2021},
  url = {https://arxiv.org/abs/2107.12280},
  note = {Source identifier: 2107.12280}
}