@misc{indiciae85cb89e26e68,
  title = {Predicting Patch Correctness Based on the Similarity of Failing Test Cases},
  author = {Haoye Tian and Yinghua Li and Weiguo Pian and Abdoul Kader Kaboré and Kui Liu and Andrew Habib and Jacques Klein and Tegawendé F. Bissyande},
  year = {2022},
  url = {https://arxiv.org/abs/2107.13296},
  note = {Source identifier: 2107.13296}
}