@misc{indiciaeaadd76e86e9a,
  title = {Metrology of Band Topology via Resonant Inelastic X-ray Scattering},
  author = {Sangjin Lee and Kyung-Hwan Jin and Byungmin Kang and B. J. Kim and Gil Young Cho},
  year = {2022},
  url = {https://arxiv.org/abs/2108.02211},
  note = {Source identifier: 2108.02211}
}