TY  - RPRT
TI  - Metrology of Band Topology via Resonant Inelastic X-ray Scattering
AU  - Sangjin Lee
AU  - Kyung-Hwan Jin
AU  - Byungmin Kang
AU  - B. J. Kim
AU  - Gil Young Cho
PY  - 2022
UR  - https://arxiv.org/abs/2108.02211
ID  - 2108.02211
ER  -