TY  - RPRT
TI  - Measuring photoexcited electron and hole dynamics in ZnTe and modeling excited state core-valence effects in transient XUV reflection spectroscopy
AU  - Hanzhe Liu
AU  - Jonathan M. Michelsen
AU  - Isabel M. Klein
AU  - Scott K. Cushing
PY  - 2021
UR  - https://arxiv.org/abs/2108.02262
ID  - 2108.02262
ER  -