TY  - RPRT
TI  - Effect of Interfacial Defects on the Electronic Properties of MoS$_2$ Based Lateral T-H Heterophase Junctions
AU  - Mohammad Bahmani
AU  - Mahdi Ghorbani-Asl
AU  - Thomas Frauenheim
PY  - 2021
DO  - 10.1039/d1ra06010d
UR  - https://arxiv.org/abs/2108.03723
ID  - 2108.03723
ER  -