TY  - RPRT
TI  - Estimation of the lowest limit of 1/f noise in semiconductor materials
AU  - Ferdinand Grueneis
PY  - 2021
DO  - 10.1016/j.physleta.2019.126145
UR  - https://arxiv.org/abs/2108.07688
ID  - 2108.07688
ER  -